XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

X-ray Tuble Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability ≤ 0.01 %
Tube Current 5 to 80 mA
Tube Voltage 10 to 60 kV
Rated Power 3 kW
Goniometer Structure Horizontal (Ø to 2 Ø )
Radius of Diffraction 185 mm
Scanning Range 0 to 164
Scanning Speed 0.0012º to 70 º min
Maximum Resolving Speed 100 º / min
Scanning Mode Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy 1 / 1000 º
Minimal Stepping Angle 1 / 1000 º
Detector Proportional/Scintillation counters
Maximum Counting rate of Linearity 5 × 10<sup>5 </sup> CPS (with the compensate function of dropout counting)
Energy Resolution Ratio ≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure ≤ 0.01 %
Scattered Rays Dose ≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability ≤ 0.5 %
Dimension 1100 × 850 × 1750 mm
Weight About 25 kg
  • Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
  • Coupled with an auto-switching dual wavelength optic
  • Horizontal Goniometer structure
  • Proportional/Scintillation counters detector
  • For testing unknown samples it has phase identification and phase analysis for known mixed samples
  • Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
  • Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
  • High throughput with high accuracy diffraction angle measurement
  • Scanning range and Scanning speed are well design in equipment
Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.

XRD Diffractometer

FTIR Spectrometer

FTIR Spectrometer LIR-B10

FTIR Spectrometer LIR-B10

  • Spectral Range
  • 7800 cm-1 to 350 cm-1
  • Resolution
  • 0.85 cm-1
  • Wave number precision
  • ± 0.01 cm-1

Atomic Fluorescence Spectrometer

Atomic Fluorescence Spectrometer LAFS-A10

Atomic Fluorescence Spectrometer LAFS-A10

  • Beam Configuration
  • Dual Channel
  • Elements ( Measuring Range )
  • As, Se, Pb, Bi, Sb, Te, Sn< 0.01 µg/LHg, Cd< 0.001 µg/LZn< 1.0 µg/LGe< 0.1 µg/L
  • Precision ( RSD )
  • < 1.0

ICP Spectrometer

ICP Spectrometer LICP-A12

ICP Spectrometer LICP-A12

  • Wavelength range
  • 195 to 800 mm
  • Elements per minute
  • 10 elements
  • Temperature range
  • 32 °C
ICP spectrometer LICP-A10

ICP spectrometer LICP-A10

  • Wavelength range ( 3600 lines / mm )
  • 180 to 500 nm
  • Wavelength range ( 2400 lines / mm )
  • 180 to 800 nm
  • Temperature
  • 20 ~ 28 °C
ICP Spectrometer LICP-B10

ICP Spectrometer LICP-B10

  • Monochromator Specifications
  • Optical typeCzerny turnerResolution≤ 0.015nm (3600 line grating) ≤ 0.030nm (2400 line grating)Focal length1000 mmGrating specificationshuge holographic grating with 3600 L/mil or 2400 L/mil and 80 mm × 100 mm of ruling areaWavelength range195 to 500 nm for 3600 line grating 195 to 800 nm for 2400 line grating
  • Solid State Power Specifications
  • Frequency27.12 MHz Frequency stability: < 0.05%Spray chamberScott double pass spray chamberOutput power800 W to 1600 W, adjustable with power efficiency more than 65%Output power stability≤ 0.05%Induction coil25 mm × 3 ID (ID-internal diameter), equipped with three concentric quartz torch tubes 35 mm ED (ED-external diameter)
  • Technical Specifications
  • Suitable sample content rangeLiquid sample: 0.01 ppm to several thousand ppm Solid or power sample: 0.001% to 70%Repeatabilityshort-term stability- RSD ≤ 1.5% Long-term stability: RSD ≤ 2%Test speed5 to 8 elements / minLimits of detection (LOD, µg/L) for most elements1ppb to 10ppb
ICP Spectrometer LICP-A11

ICP Spectrometer LICP-A11

  • Wavelength range
  • 180 to 900 nm
  • Elements per minute
  • 15 elements
  • Temperature
  • 29 °C

XRF Spectrometer

Handheld XRF Spectrometer LXRF-B10

Handheld XRF Spectrometer LXRF-B10

  • Analytical Method
  • Energy dispersive X-ray fluorescence analytical Method
  • Elements Measuring
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
  • Range
  • Simultaneous detector
Handheld XRF Spectrometer LXRF-B11

Handheld XRF Spectrometer LXRF-B11

  • Analytical Method
  • Energy dispersive X-ray fluorescence analytical Method
  • Elements Measuring
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
  • Range
  • Simultaneous detector
XRF-Spectrometer LXRF-A10

XRF-Spectrometer LXRF-A10

  • Measureable elements
  • S to U
  • Detection limit
  • 1 ppm
  • Temperature
  • 15 ~ 30 °C